Scanning Electron Microscope

Scanning Electron Microscope (SEM)

This test is essential in order to detect new techniques of counterfeiting electronic components. The SEM output is high resolution image at magnitude of x500 - x2000, providing sharp details of the surface topography, allowing detecting of differences between surface textures and a clear observation of grain boundaries of the sample.The scanning electron microscope (SEM) uses a focused beam of high energy electrons for scanning the images.

SEM micrographs have a very narrow electron beam, which allow them to have a large depth of field yielding a characteristic three-dimensional appearance. This fact is extremely useful for understanding the surface structure of a sample.

This test results are usually the most detailed, provides in-depth visual analyses of electronic components. The microscope is used strictly for counterfeit detection and is a main investigation tool for evidence of counterfeiting, especially where other tools unable to help.

SEM - Scanning Electron Microscope