Electrical Test of electronic components is performed to verify that the device is functioning well and in accordance with the manufacturer’s specification.
The devices are being tested at various conditions to ensure they remain fully functional.
Passive Components, Integrated Circuits, FPGA, Memories - require specific electrical tests, using different equipment, S/W setup and testing procedures.
IC’s Functionality Test:
The device is being setup, configured and being functional tested. Typical equipment required: H/W board, socket and developing of testing S/W. Performed on FPGA, CPLD, uP, SoC, application specific IC’s.
Industrial Temperature Test:
Similar to the functionality test in room conditions, this functional test is performed in extreme conditions (e.g. -40°C and +125°C) to verify that the device is fully functional.
Upgrade and Screening:
Commercial grade devices are being tested in industrial temperature range and in order to screen the devices that can be upgraded to Industrial Grade.
Memories Blank Check:
Reading the content of all memories cells to verify there is no existing data stored (evidence of prior use, or, factory programmed devices). Performed on non-volatile memories - Flash, EEPROM, HDD.
Memories Write/Read Test:
This test verifies that all memory cells are functional, by writing each cell and reading it. Performed on Volatile and non-volatile memories: Flash, EEPROM, DDR.
Passive Components:
Passive Components are being tested using a digital multimeter and precision LCR meters, to verify the parameters are within the permitted range of values.
Energy Dispersive X-Ray spectroscopy
Scanning Electron Microscope (SEM) Imaging
Component Decapsulation and Die verification