This test is essential in order to detect new techniques of counterfeiting electronic components. The SEM output is high resolution image at magnitude of x500 - x2000, providing sharp details of the surface topography, allowing detecting of differences between surface textures and a clear observation of grain boundaries of the sample.The scanning electron microscope (SEM) uses a focused beam of high energy electrons for scanning the images.
SEM micrographs have a very narrow electron beam, which allow them to have a large depth of field yielding a characteristic three-dimensional appearance. This fact is extremely useful for understanding the surface structure of a sample.
This test results are usually the most detailed, provides in-depth visual analyses of electronic components. The microscope is used strictly for counterfeit detection and is a main investigation tool for evidence of counterfeiting, especially where other tools unable to help.